Multifunction
Digilent and MCC offer a variety of multifunction and high-speed Data Acquisition (DAQ) devices designed for educational, research, and prototyping purposes with sample rates up to 20 MS/s. In addition to analog input, these multifunction devices also offer analog output, digital I/O and counter/timers.
A multifunction Data Acquisition device is a versatile piece of equipment designed to perform a wide range of measurement and control tasks in various applications. Unlike specialized DAQ devices that focus on specific functions or signal types, such as voltage measurement or temperature sensing, a multifunction DAQ device integrates multiple input and output channels and supports diverse sensor types and signal conditioning options.
A high-speed Data Acquisition device is designed to capture and process data at significantly faster rates compared to standard DAQ systems. These devices are engineered to handle high-frequency signals and rapidly changing data with precision and accuracy and offer several significant advantages and bring considerable value to various industries and applications.
Among the types of DAQ solutions available are data loggers, which are specialized DAQ devices built for independent operation. Data loggers from Digilent and MCC are compact electronic devices designed for automatic, continuous, and unattended recording of various parameters over time. They are invaluable for gaining insights into trends in diverse applications like environmental monitoring and preventive maintenance, especially in remote locations.
Many industries combine high-speed DAQ with data loggers to capture bursts of signal activity and then store the information for deeper analysis or regulatory documentation.
By enabling rapid data acquisition and analysis, high-speed DAQ products help engineers and researchers streamline testing procedures, accelerate development cycles, and identify issues more efficiently. This leads to improved productivity, reduced time-to-market, and cost savings in product development and testing processes.